Removal of Oxygen from Neodymium by Halide Flux Treatment |
H. Sano, M. Tashiro, T. Fujisawa, Ch. Yamauchi |
VALUE-ADDITION METALLURGY, San Antonio, (1998), 87-94. |
Thermodynamics of the Si-B-N System |
M. Tanahashi, T. Fujisawa, Ch. Yamauchi |
VALUE-ADDITION METALLURGY, San Antonio, (1998), 103-109. |
In-situ high-resolution electron microscopy of formation process of Au/Au point-contact boundaries |
Tokushi Kizuka |
Proc. Int. Symp. on Hybrid Analyses for Functional Nanostructure, 1998, Kyoto, in print. |
In-situ high-resolution electron microscopy of formation process of Si/Si tunnel junctions by mechanical contact |
Tokushi Kizuka and Kazue Hosoki |
Proc. Int. Symp. on Hybrid Analyses for Functional Nanostructure, 1998, Kyoto, in print. |
In-situ high-resolution electron microscopy of formation process of Si/Au/Si quantum dots by mechanical contact |
Tokushi Kizuka and Kazue Hosoki |
Proc. Int. Symp. on Hybrid Analyses for Functional Nanostructure, 1998, Kyoto, in print. |
Atomistic solid junction in time-resolved high-resolution transmission electron microscopy (Overview talk) |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, p2-2, in print. |
Atomistic solid junction - I. Gold/gold contact |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, P1, in print. |
Atomistic solid junction -II. Deformation in point contact |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, P2, in print. |
Atomistic solid junction -III. Surface scanning |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, P3, in print. |
Atomistic solid junction - IV.Grain boundary sliding |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, P4, in print. |
Atomistic solid junction - V.Silicon tunnel junctions |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, P5, in print. |
Atomistic solid junction -VI. Silicon/gold quantum dots |
Tokushi Kizuka |
Proc. Int. Symp. Soild Junction, 1998, Tokyo, P6, in print. |
High-resolution transmission electron microscopy using a
piezo-driving specimen holder for atomic mechanics - I. Method and
resolutions |
Tokushi Kizuka, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 491-492. |
High-resolution transmission electron microscopy using a
piezo-driving specimen holder for atomic mechanics - II. Atomistic
contact in gold |
Tokushi Kizuka, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 525-526. |
High-resolution transmission electron microscopy using a
piezo-driving specimen holder for atomic mechanics - III. Contact and
non contact surface scanning |
Tokushi Kizuka, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 527-528. |
High-resolution transmission electron microscopy using a
piezo-driving specimen holder for atomic mechanics - IV. Deformation in
gold |
Tokushi Kizuka, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 529-530. |
High-resolution transmission electron microscopy using a
piezo-driving specimen holder for atomic mechanics - V. Grain boundary
sliding |
Tokushi Kizuka, Motoichi Mizutani, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 531-532. |
High-resolution transmission electron microscopy using a piezo-driving specimen holder for atomic mechanics - VI. Si/Si bonding |
Tokushi Kizuka, Kazue Hosoki, Nobuo Tanaka, Shunji Deguchi Mikio Naruse and Hideki Takagi |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 533-534. |
High-resolution transmission electron microscopy using a
piezo-driving specimen holder for atomic mechanics - VII. Fatigue of
carbon nanotube |
Tokushi Kizuka, Kaori Hirahara, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse、 |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 535-536. |
A specimen holder of high-resolution transmission electron
microscopy for in situ observation of epitaxial growth in
vacuum-deposition |
Tokushi Kizuka, Yoshihiko Tsuzuki, Takao Sumi, Motoki Kozuka, Katsuyoshi Kumazawa and Nobuo Tanaka |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 539-540. |
Atomistic electron beam processing in high-resolution transmission electron microscopy |
Tokushi Kizuka, Nobuo Tanaka and Takashi Yanaka |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 537-538. |
Three-dimensional high-resolution transmission electron microscopy of carbon nanotubes using a piezo-driving specimen holder |
Tokushi Kizuka, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 109-110. |
Time-resolved HRTEM of nanophase materials |
N. Tanaka and T. Kizuka, |
Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 553-554. |
Hollow-cone darkfield TEM of semiconductor interfaces - GaN/Al2O3 and PbTe/Pbte |
N. Tanaka, D. Yamada, U. Mizutani and T. Kizuka, | Proc. 14th Int. Conf. Electron Microsc., 1998, Cancun, Mexico, 555-556. |
Direct Atomistic Observation of Gold/Gold Contact by Time-resolved High-resolution Transmission Electron Microscopy. |
Tokushi Kizuka, Kanji Yamada, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 103-106. |
Direct Atomistic Observation of Friction between Gold Surfaces by
Time-resolved High-resolution Transmission Electron Microscopy. |
Tokushi Kizuka, Kanji Yamada, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 107-110. |
Direct Atomistic Observation of Deformation in Gold by Time-resolved High-resolution Transmission Electron Microscopy. |
Tokushi Kizuka, Kanji Yamada, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 111-113. |
Direct Atomistic Observation of Grain Boundary Sliding in Gold by
Time-resolved High-resolution Transmission Electron Microscopy. |
Tokushi Kizuka, Kanji Yamada, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 114-116. |
Direct Atomistic Observation of Silicon/Silicon Contact by Time-resolved High-resolution Transmission Electron Microscopy. |
Tokushi Kizuka, Kanji Yamada, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 117-119. |
Direct Atomistic Observation of Deformation of Carbon Nanotubes by
Time-resolved High-resolution Transmission Electron Microscopy. |
Kaori Hirahara, Nobuo Tanaka, Shunji Deguchi and Mikio Naruse and Tokushi Kizuka, |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 31-34. |
Preparation and characterization of yungsten nano-clusters embedded in MgO single crystalline films |
Nobuo Tanaka, Tatuya Takashima and Tokushi Kizuka |
Proc. 4th Special Symposium on Advanced Materials, 1998, Japan, Nagoya, 27-30. |